4D-STEM
Note
These documents cover 4D-STEM techniques and algorithms. They are living documents and are updated over time. Please refer to the Literature page to view all citations related to these techniques.
4D-STEM (4-Dimensional Scanning Transmission Electron Microscopy) is a powerful technique that records a complete diffraction pattern at every scan position in a STEM experiment. Unlike traditional STEM which only records single intensity values, 4D-STEM captures rich information about how electrons interact with the sample at each point.
Contents
- Phase contrast physics
- Phase retrieval methods
- Diffraction peak detection
- Strain measurement and analysis
- Orientation mapping
- Phase contrast transfer function
- Single sideband imaging
- High-level overview
- Why SSB?
- Physical setup and approximations
- Sideband formation in reciprocal space
- Phase extraction from single sideband
- Probe specification and aberration measurement
- Parameters that cannot be reliably estimated
- Practical guide for using SSB
- Advantages and limitations
- Implementation in quantem
- SSB transfer function
- Reconstruction workflow
- Optimizing probe parameters
- Code organization
- Transfer function computation
- Probe evaluation
- Reconstruction pipeline
- Usage examples
- References
- Precession electron diffraction
- In-situ 4D-STEM