4D-STEM

Note

These documents cover 4D-STEM techniques and algorithms. They are living documents and are updated over time. Please refer to the Literature page to view all citations related to these techniques.

4D-STEM (4-Dimensional Scanning Transmission Electron Microscopy) is a powerful technique that records a complete diffraction pattern at every scan position in a STEM experiment. Unlike traditional STEM which only records single intensity values, 4D-STEM captures rich information about how electrons interact with the sample at each point.