Precession electron diffraction

PED was developed to study thicker species that scatter the eam multiple times. A tilt is applied away from the optial axis and precessed around the optic axis during acquisition. This averages out dynamical effects and produces diffraction patterns that are more kinematical in nature. PED can be combined with 4D-STEM to produce precession 4D-STEM datasets that are less sensitive to thickness and orientation effects.

To be added more..